- Description
- Parameters
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● Specificities
(1) 2D Flexure-Guided Scanner with 100 um x 100 um Scanning Range
(2) Low noise XYZ position sensor
(3) Step scanning automation
(4) Automated engagement via slide-attached SLD head
(5) Expansion slot for advanced SPM modes and options
(6) High-speed 24-bit digital electronics
(7) High-speed Z-scanner with 15 μm scanning range
(8) Motorized XY sample stage with optional encoder
(9) Accessible sample holders
(10) Direct coaxial high power optics with integrated LED illumination
(11) Vertically aligned motorized Z stage and focusing stage
● Norm
Scanners Z scanner XY scanner Guided High Force Bend Scanner Single-module flexible XY scanner with dual servo closed-loop control Scanning range: 15 pm (30 pm optional) Scanning range: 100 μm x 100 μm Height noise level: 30 pm (Optional 50 μm x 50 μm) 0.5 kHz bandwidth, rms (typical) Point Z-carrier range :25 mm (motorized) Focus travel range :15 mm (motorized) XY load table travel range :150 mm x 150 mm (motorized) Sample Installation Sample size: open space up to 150 mm x 150 mm, thickness up to 20 mm (optional, up to 200 mm x 200 mm) Sample weight: <500g Electronically 10x (0.23 NA) extra long working distance lens (1 um resolution) Direct synoptic field of view of sample surface and county arm 840 x 630 um (with 10x objective) CCD : 1M pixels, 5M pixels (optional) Hardware Smart ScanTM Specialized system control and data acquisition software Real-time departmental feedback parameters Script level control via external program ( optional ) XEI AFM data analysis software Electronic product integrated function 4-channel flexible digital lock-in amplifier Digital Q Control signal processing ADC: 18 channels of 4 high-speed ADCs Channel 24-bit ADC for X, Y and Z scanner position sensors DAC: 17 channels 2 high-speed DAC channels 20-bit DAC for X, Y and Z scanner positioning Maximum data size: 4096 x 4096 pixels External Signal Access 20 embedded signal input/output ports 5 TTL outputs: EOF, EOL, EOP, Modulation and AC Bias AFM Mode
(*optional)
Standard imaging Force measurement True contactless AFM Force Distance (F/d) Spectrum PinPointTM AFM force volume imaging (physics) Basic Contact AFM Lateral Force Microscope (LFM) Phase imaging Tapping AFM Dielectric/piezoelectric properties mechanical property Electric Force Microscopy (EFM) Force Modulation Microscopy (FMM) Dynamic Contact EFM (EFM-DC) Nanoindentation* Piezoresponse Force Microscopy (PFM) Nanolithography* High pressure PFM* High voltage nanolithography* Nanomanipulation* Magnetic* Magnetic Force Microscope (MFM) Tunable Magnetic Field MFM Electrical Characteristics Conducted AFM (C-AFM)* IV. Energy spectrum* Kelvin Probe Force Microscope (KPFM) Scanning Capacitance Microscopy (SCM)* Scanning Spreading Resistance Microscope (SSRM)* Scanning Tunneling Microscope (STM)* Photocurrent mapping (PCM)* Chemical properties* Chemical Force Microscope with Functionalized Tip Electrochemical Microscope (EC-AFM)
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Address: Room 102, Building 23, No. 88, Haidian Road, Hecheng Street, Gaoming District, Foshan City, Guangdong Province, China
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